Patent · US Expired

Dual gate FinFet

US7091566B2 · kind B2 · utility

53Cited by
20References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 2003
Grant dateAug 15, 2006
Priority date
Expiry dateApr 3, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6217

Abstract

A field effect transistor (FET), integrated circuit (IC) chip including the FETs and a method of forming the FETS. Each FET includes a device gate along one side of a semiconductor (e.g., silicon) fin and a back bias gate along an opposite of the fin. Back bias gate dielectric differs from the device gate dielectric either in its material and/or thickness. Device thresholds can be adjusted by adjusting back bias gate voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.