Patent · US Expired

Semiconductor memory

US7092304B2 · kind B2 · utility

7Cited by
4References
20Claims
0Family size

Assignees

Inventors

Key dates

Filing dateSep 2, 2004
Grant dateAug 15, 2006
Priority date
Expiry dateSep 15, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A dummy capacitor drive potential VDC is given to one electrode of a dummy capacitor, and a reference potential for determining a data value of a memory cell is generated in the other electrode thereof. A potential generator circuit for generating the potential VDC is composed of a BGR circuit outputting a potential VBGRTEMP having temperature dependency, and resistors R3 and R4, which are series-connected between an output terminal of the BGR circuit and a ground point. The potential VDC is output from a connection point of the resistors R3 and R4. Temperature dependency of the potential VDC is adjusted based on a resistance ratio of resistors R1-1, R1-2 and R2, and the absolute value is adjusted based on a resistance ratio of resistors R3 and R4.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.