Patent · US Expired

Magnetic switching device

US7097777B2 · kind B2 · utility

7Cited by
9References
16Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMar 2, 2005
Grant dateAug 29, 2006
Priority date
Expiry dateMar 2, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N50/01
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of forming a magnetic switching device is provided. The method includes depositing a bilayer hardmask, which may comprise a first mask layer of titanium nitride with a second mask layer of tungsten formed thereon. A first lithography process is performed to pattern the second mask layer, and a second lithography process is performed to pattern the first mask layer. Thereafter, the magnetic tunnel junction stack may be patterned in accordance with the first mask layer. An etching process may be performed to further pattern the first mask layer in accordance with the second mask layer. An optional passivation layer may be formed over the first mask layer and the second mask layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.