Patent · US Expired

Semiconductor device and a method of manufacturing the same

US7102223B1 · kind B1 · utility

25Cited by
5References
34Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 5, 2003
Grant dateSep 5, 2006
Priority date
Expiry dateSep 5, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device includes plural electrode pads arranged in an active region of a semiconductor chip, and wiring layers provided below the plural electrode pads wherein occupation rates of wirings arranged within the regions of the electrode pads are, respectively, made uniform for every wiring layer. To this end, in a region where an occupation rate of wiring is smaller than those in other regions, a dummy wiring is provided. On the contrary, when the occupation rate of wiring is larger than in other regions, slits are formed in the wiring to control the wiring occupation rate. In the respective wirings layers, the shapes, sizes and intervals of wirings below the respective electrode pads are made similar or equal to one another.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.