Patent · US Expired

Methods of reducing the susceptibility of PLD designs to single event upsets

US7111215B1 · kind B1 · utility

14Cited by
8References
64Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 2004
Grant dateSep 19, 2006
Priority date
Expiry dateApr 3, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/17764
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

Methods of implementing designs in programmable logic devices (PLDs) to reduce susceptibility to single-event upsets (SEUs) by taking advantage of the fact that most PLD designs leave many routing resources unused. The unused routing resources can be used to provide duplicate routing paths between source and destination of signals in the design. The duplicate paths are selected such that an SEU affecting one of the duplicate paths simply switches the signal between the two paths. Thus, if one path is disabled due to an SEU, the other path can still provide the necessary connection, and the functionality of the design is unaffected. The methods can be applied, for example, to routing software for field programmable gate arrays (FPGAs) having programmable routing multiplexers controlled by static RAM-based configuration memory cells.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.