Patent · US Expired

Plasma processing system and method

US7112536B2 · kind B2 · utility

3Cited by
11References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2003
Grant dateSep 26, 2006
Priority date
Expiry dateApr 17, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3266
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing system and method wherein a power source produces a magnetic field and an electric field, and a window disposed between the power source and an interior of a plasma chamber couples the magnetic field into the plasma chamber thereby to couple power inductively into the chamber and based thereon produce a plasma in the plasma chamber. The window can be shaped and dimensioned to control an amount of power capacitively coupled to the plasma chamber by means of the electric field so that the amount of capacitively coupled power is selected in a range from zero to a predetermined amount. Also, a tuned antenna strap having r.f. power applied thereto to produce a standing wave therein can be arranged adjacent the window to couple magnetic field from a current maximum formed in the strap to the interior of the chamber. A desired amount of magnetic field and/or electric field coupling can be produced by arrangement of the chamber window adjacent that portion of the antenna strap exhibiting the desired current/voltage relationship. The system may be formed in a line source configuration, or in a cylindrical source configuration. The window may have slots and/or apertures, …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.