TEM sample holder
US7115882B2 · kind B2 · utility
18Cited by
7References
31Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 19, 2006 |
| Grant date | Oct 3, 2006 |
| Priority date | — |
| Expiry date | Jan 19, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/5147
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A TEM sample holder is formed by cutting the TEM sample holder form from a coupon in a press. The cutting at the same time joins the tip point of a nano-manipulator probe tip with the formed TEM sample holder. The tip point of the probe has a sample attached for inspection in a TEM. The cutting process also creates a gap in the sample holder to allow for FIB milling of the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.