Thomas M. Moore
38Patents
13h-index
18Co-inventors
78Inventor score
Filing activity: Jan 17, 1977 → Aug 26, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6420722B2 | Method for sample separation and lift-out with one cut | Electricity | 131 | Expired |
| US6570170B2 | Total release method for sample extraction from a charged-particle instrument | Electricity | 45 | Expired |
| US7381971B2 | Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope | Electricity | 23 | Expired |
| US7414252B2 | Method and apparatus for the automated process of in-situ lift-out | Electricity | 23 | Active |
| US4040577A | Lockwood airfoil used in conjunction with man transport device | Performing Operations; Transporting | 18 | Expired |
| US7115882B2 | TEM sample holder | Emerging Cross-Sectional Technologies | 18 | Expired |
| US4622836A | Loft and lie calibration machine | Human Necessities | 17 | Expired |
| US8227781B2 | Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument | Electricity | 17 | Active |
| US7126133B2 | Kit for preparing a tem sample holder | Emerging Cross-Sectional Technologies | 16 | Expired |
| US5641906A | Apparatus and method for automated non-destructive inspection of integrated circuit packages | Physics | 14 | Expired |
| US7785233B1 | Collapsible hurdle with quick reset | Human Necessities | 13 | Active |
| US6777674B2 | Method for manipulating microscopic particles and analyzing | Physics | 13 | Expired |
| US5046363A | Apparatus for rapid non-destructive measurement of die attach quality in packaged integrated circuits | Physics | 13 | Expired |
| US5627320A | Apparatus and method for automated non-destructive inspection of integrated circuit packages | Physics | 12 | Expired |
| US7126132B2 | Apparatus for preparing a TEM sample holder | Emerging Cross-Sectional Technologies | 11 | Expired |
| US8440969B2 | Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images | Electricity | 10 | Active |
| US7644637B2 | Method and apparatus for transfer of samples in a controlled environment | Emerging Cross-Sectional Technologies | 9 | Active |
| US7395727B2 | Strain detection for automated nano-manipulation | Emerging Cross-Sectional Technologies | 9 | Expired |
| US6435398B2 | Method for chemically reworking metal layers on integrated circuit bond pads | Electricity | 9 | Expired |
| US7315023B2 | Method of preparing a sample for examination in a TEM | Emerging Cross-Sectional Technologies | 7 | Active |
| US7935937B2 | Method of forming TEM sample holder | Electricity | 5 | Active |
| US7053383B2 | Method and apparatus for rapid sample preparation in a focused ion beam microscope | Electricity | 5 | Expired |
| US7834315B2 | Method for STEM sample inspection in a charged particle beam instrument | Electricity | 4 | Active |
| US6561868B1 | System and method for controlling a polishing machine | Performing Operations; Transporting | 4 | Expired |
| US8247768B2 | Method for stem sample inspection in a charged particle beam instrument | Electricity | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.