Omniprobe, Inc.
30Patents
20Active
30Granted
48Portfolio score
Filing activity: May 23, 2001 → Jul 11, 2015 · 13 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6420722B2 | Method for sample separation and lift-out with one cut | Electricity | 131 | Expired |
| US6570170B2 | Total release method for sample extraction from a charged-particle instrument | Electricity | 45 | Expired |
| US7414252B2 | Method and apparatus for the automated process of in-situ lift-out | Electricity | 23 | Active |
| US7381971B2 | Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope | Electricity | 23 | Expired |
| US7115882B2 | TEM sample holder | Emerging Cross-Sectional Technologies | 18 | Expired |
| US7126133B2 | Kit for preparing a tem sample holder | Emerging Cross-Sectional Technologies | 16 | Expired |
| US6777674B2 | Method for manipulating microscopic particles and analyzing | Physics | 13 | Expired |
| US7126132B2 | Apparatus for preparing a TEM sample holder | Emerging Cross-Sectional Technologies | 11 | Expired |
| US8440969B2 | Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images | Electricity | 10 | Active |
| US7644637B2 | Method and apparatus for transfer of samples in a controlled environment | Emerging Cross-Sectional Technologies | 9 | Active |
| US7395727B2 | Strain detection for automated nano-manipulation | Emerging Cross-Sectional Technologies | 9 | Expired |
| US7315023B2 | Method of preparing a sample for examination in a TEM | Emerging Cross-Sectional Technologies | 7 | Active |
| US7935937B2 | Method of forming TEM sample holder | Electricity | 5 | Active |
| US7053383B2 | Method and apparatus for rapid sample preparation in a focused ion beam microscope | Electricity | 5 | Expired |
| US7208724B2 | Apparatus and method of detecting probe tip contact with a surface | Electricity | 4 | Expired |
| US8247768B2 | Method for stem sample inspection in a charged particle beam instrument | Electricity | 4 | Active |
| US7834315B2 | Method for STEM sample inspection in a charged particle beam instrument | Electricity | 4 | Active |
| US8394454B2 | Method and apparatus for precursor delivery system for irradiation beam instruments | Chemistry; Metallurgy | 3 | Active |
| US8513622B2 | Method for extracting frozen specimens and manufacture of specimen assemblies | Electricity | 3 | Active |
| US7961397B2 | Single-channel optical processing system for energetic-beam microscopes | Electricity | 2 | Active |
| US8288740B2 | Method for preparing specimens for atom probe analysis and specimen assemblies made thereby | Electricity | 1 | Active |
| US7446542B2 | Apparatus and method for automated stress testing of flip-chip packages | Physics | 1 | Active |
| US9349573B2 | Total release method for sample extraction in an energetic-beam instrument | Electricity | 1 | Active |
| USRE46350E1 | Method for stem sample inspection in a charged particle beam instrument | General | 0 | Active |
| US8054558B2 | Multiple magnification optical system with single objective lens | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.