Patent · US Expired

Method for ball grid array chip packages having improved testing and stacking characteristics

US7116122B2 · kind B2 · utility

3Cited by
42References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 24, 2005
Grant dateOct 3, 2006
Priority date
Expiry dateJan 24, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A stackable ball grid array (BGA) or fine ball grid array (FBGA) semiconductor package particularly suitable for board-on-chip or chip-on-board applications in which a low profile BGA or FBGA semiconductor package is needed. The stackable ball grid array (BGA) or fine ball grid array (FBGA) provides a semiconductor package that is capable of being burned in and tested in a more efficient and cost effective manner than prior known BGA or FBGA semiconductor packages. A high density, low profile memory module incorporating a plurality of the disclosed BGA or FBGA semiconductor packages in a stacked arrangement is further disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.