Data generator for generating test data for word-oriented semiconductor memories
US7120841B2 · kind B2 · utility
4Cited by
5References
9Claims
0Family size
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Inventor
Key dates
| Filing date | Jul 22, 2002 |
| Grant date | Oct 10, 2006 |
| Priority date | — |
| Expiry date | Aug 23, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A data generator for generating test data for a word-oriented semiconductor memory is integrated on a semiconductor chip of the semiconductor memory. The data generator has a shift register.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.