Patent · US Expired

Stud-cone bump for probe tips used in known good die carriers

US7122895B2 · kind B2 · utility

0Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 1, 2001
Grant dateOct 17, 2006
Priority date
Expiry dateMar 26, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19107
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of forming a membrane for use in conjunction with a semiconductor carrier and the membrane which includes an electrically insulating substrate and an interconnect pattern formed on the substrate. A stud is coupled to the interconnect pattern over the substrate by forming a gold ball, preferably by gold ball bonding techniques, and coating a portion of the gold ball with a compliant material, preferably an epoxy resin. The coating is filled with a material having sufficient hardness to be capable of penetrating the oxide film on the contact pads of semiconductor devices. The flakes are preferably silver or silver-based.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.