Patent · US Expired

Kit for preparing a tem sample holder

US7126133B2 · kind B2 · utility

16Cited by
11References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 19, 2006
Grant dateOct 24, 2006
Priority date
Expiry dateJan 19, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/5147
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A kit for preparing TEM sample holders includes at least one TEM coupon made of a sheet of material and having one or more paths from its edge to a TEM sample holder form embodied in the TEM coupon. There is at least one hole in the coupon defining the outer boundary of the TEM sample holder form. This hole has a mouth that defines a land of material. This land connects the TEM sample holder form to the edge of the sheet. The kit preferably includes at least one probe tip, where the probe tip has a probe-tip point, and finally, a press. The press has inner and outer dies and a former rod opposing the inner and outer dies. A shear punch is situated coaxially with the former rod. Thus, when an actuator drives the shear punch toward the inner and outer dies, the shear punch severs the land and cuts an opening in the TEM sample holder form, and simultaneously the former rod presses the probe tip point or points into the sheet of material. The result is a TEM sample holder with probe-tip points embedded in it, ready for inspection in a TEM of samples attached to the probe-tip points.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.