Patent · US Expired

Test method and test device for electronic memories

US7127650B2 · kind B2 · utility

2Cited by

10References

31Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Abel Rios-Baez · Birkenfeld, DE
Michael Kund · Bad Aibling, DE

Key dates

Filing date	Jul 11, 2002
Grant date	Oct 24, 2006
Priority date	—
Expiry date	Nov 28, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/40
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A test method for electronic memories includes reading out a previously defined test pattern sequentially as a time-dependent signal from the memory, determining the associated spectrum from the time-dependent signal by Fourier transformation, and assessing the memory to be tested using the spectrum. Also included is a suitable test device for the method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.