Inventor · Bad Aibling, DE

Michael Kund

28Patents
9h-index
36Co-inventors
71Inventor score

Filing activity: May 17, 1999 → Oct 11, 2011

Most-cited inventions

PatentTitleAreaCited byStatus
US7405418B2 Memory device electrode with a surface structure Physics 80 Expired
US7215568B2 Resistive memory arrangement Physics 60 Expired
US7751163B2 Electric device protection circuit and method for protecting an electric device Electricity 54 Active
US7894253B2 Carbon filament memory and fabrication method Emerging Cross-Sectional Technologies 19 Active
US7337282B2 Memory system and process for controlling a memory component to achieve different kinds of memory characteristics on one and the same memory component Physics 12 Expired
US7372716B2 Memory having CBRAM memory cells and method Physics 11 Expired
US7457145B2 Write/delete process for resistive switching memory components Physics 10 Expired
US7561460B2 Resistive memory arrangement Physics 10 Active
US8063394B2 Integrated circuit Electricity 9 Active
US6674627B1 Needle-card adjusting device for planarizing needle sets on a needle card Physics 8 Expired
US6256243A Test circuit for testing a digital semiconductor circuit configuration Physics 8 Expired
US7436694B2 Nonvolatile memory cell Physics 8 Active
US8595449B2 Memory scheduler for managing maintenance operations in a resistive memory in response to a trigger condition Physics 7 Active
US7400528B2 Intergrated circuit for programming resistive memory cells Physics 6 Active
US7514362B2 Integrated circuit including sub-lithographic structures Electricity 5 Active
US6359457B1 Method of holding a wafer and testing the integrated circuits on the wafer Physics 4 Expired
US7997791B2 Temperature sensor, integrated circuit, memory module, and method of collecting temperature treatment data Physics 4 Active
US7583527B2 Tunable resistor and method for operating a tunable resistor Electricity 3 Active
US6970006B2 Apparatus for the automated testing, calibration and characterization of test adapters Physics 3 Expired
US7400526B2 Memory element, memory read-out element and memory cell Physics 2 Active
US7127650B2 Test method and test device for electronic memories Physics 2 Expired
US6661694B2 Configuration and method for increasing the retention time and the storage security in a ferroelectric or ferromagnetic semiconductor memory Physics 2 Expired
US8063448B2 Resistive memory and method Electricity 1 Active
US7384002B2 Chip card and chip card security device Electricity 1 Expired
US9443583B2 Resistive memory and method Electricity 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.