Patent · US Expired

Process for producing group III nitride compound semiconductor

US7128846B2 · kind B2 · utility

88Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 24, 2003
Grant dateOct 31, 2006
Priority date
Expiry dateFeb 24, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02647
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method including the steps of: modifying at least one part of a sapphire substrate by dry etching to thereby form any one of a dot shape, a stripe shape, a lattice shape, etc. as an island shape on the sapphire substrate; forming an AlN buffer layer on the sapphire substrate; and epitaxially growing a desired Group III nitride compound semiconductor vertically and laterally so that the AlN layer formed on a modified portion of the surface of the sapphire substrate is covered with the desirably Group III nitride compound semiconductor without any gap while the AlN layer formed on a non-modified portion of the surface of the sapphire substrate is used as a seed, wherein the AlN buffer layer is formed by means of reactive sputtering with Al as a target in an nitrogen atmosphere.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.