Patent · US Expired

Method and apparatus to reduce storage node disturbance in ferroelectric memory

US7133304B2 · kind B2 · utility

24Cited by
15References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 2004
Grant dateNov 7, 2006
Priority date
Expiry dateDec 14, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods and ferroelectric devices are presented, in which pulses are selectively applied to ferroelectric memory cell wordlines to discharge cell storage node disturbances while the cell plateline and the associated bitline are held at substantially the same voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.