Method for testing circuit units to be tested by means of majority decisions and test device for performing the method
US7143325B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 1, 2004 |
| Grant date | Nov 28, 2006 |
| Priority date | — |
| Expiry date | Apr 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31919
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a test device for testing circuit units (101a–101n) to be tested, having connecting units (106a–106n) for connecting the circuit units (101a–101n) to be tested to the test device, a test system (100) and an output unit (108) for outputting test result data, the test device having a determining unit (103) for determining those of the measurement data (110a–101n) which correspond for a predeterminable number of circuit units (101a–101n) to be tested, and for defining the corresponding measurement data (110a–110n) as the expected data (111); and comparison units (104a–104n) for comparing the measurement data (110a–110n) generated by the circuit units (101a–101n) to be tested in a manner dependent on the test data (112) written in with the expected data (111) in order to obtain comparison data (115a–115n).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.