Patent · US Expired

Method of forming epitaxial silicon-comprising material

US7144779B2 · kind B2 · utility

4Cited by
21References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 2004
Grant dateDec 5, 2006
Priority date
Expiry dateSep 1, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/018
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention includes methods of forming epitaxial silicon-comprising material and methods of forming vertical transistors. In one implementation, a method of forming epitaxial silicon-comprising material includes providing a substrate comprising monocrystalline material. A first portion of the monocrystalline material is outwardly exposed while a second portion of the monocrystalline material is masked. A first silicon-comprising layer is epitaxially grown from the exposed monocrystalline material of the first portion and not from the monocrystalline material of the masked second portion. After growing the first silicon-comprising layer, the second portion of the monocrystalline material is unmasked. A second silicon-comprising layer is then epitaxially grown from the first silicon-comprising layer and from the unmasked monocrystalline material of the second portion. Other aspects and implementations are contemplated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.