Patent · US Expired

Lithographic apparatus, device manufacturing method, and device manufactured thereby

US7145641B2 · kind B2 · utility

41Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 2003
Grant dateDec 5, 2006
Priority date
Expiry dateApr 23, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70933
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A lithographic apparatus is disclosed. The apparatus includes a radiation system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to pattern the beam of radiation according to a desired pattern. The apparatus also includes a substrate support that supports a substrate, and a projection system that projects the patterned beam onto a target portion of the substrate. The projection system includes an optical element that has a beam entry area and an optical element that has a beam exit area through each of which the patterned beam passes. The apparatus further includes a nucleated surface that is associated with the projection system on which a plurality of nucleation sites are provided. The surface is disposed away from at least one of the beam entry area and the beam exit area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.