Seek window verify program system and method for a multilevel non-volatile memory integrated circuit system
US7149110B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2003 |
| Grant date | Dec 12, 2006 |
| Priority date | — |
| Expiry date | Jul 30, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/5634
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory comprises a plurality of digital multilevel memory cells. A window of valid data voltages for accessing the said plurality of digital multilevel memory cells is detected. The window may be detected by incrementing a first programming voltage to program data in the plurality of memory cells and verifying whether the data in at least one of said plurality of memory cells is properly programmed. The incrementing and verifying may be repeated until data is verified to be properly programmed in one of said plurality of memory cells. The data in each memory cell of said plurality of memory cells is verified. The verification may be by incrementing a second programming voltage, and verifying whether data in each memory cell is properly programmed within a margin. The incrementing and verifying is repeated for each memory cell outside of the margin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.