Patent · US Expired

Methods for packaging microfeature devices and microfeature devices formed by such methods

US7157310B2 · kind B2 · utility

50Cited by
92References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 2004
Grant dateJan 2, 2007
Priority date
Expiry dateSep 1, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Methods for packaging microfeature devices on and/or in microfeature workpieces at the wafer level and microfeature devices that are formed using such methods are disclosed herein. In one embodiment, a method comprises providing a workpiece including a substrate having a plurality of microelectronic dies on and/or in the substrate. The individual dies include integrated circuitry and pads electrically coupled to the integrated circuitry. The method then includes depositing an underfill layer onto a front side of the substrate. The method also includes selectively forming apertures in the underfill layer to expose the pads at the front side of the substrate. The method further includes depositing a conductive material into the apertures and in electrical contact with the corresponding pads. In one aspect of this embodiment, the underfill layer is a photoimageable material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.