Patent · US Expired

Triple pulse method for MRAM toggle bit characterization

US7158407B2 · kind B2 · utility

6Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 29, 2005
Grant dateJan 2, 2007
Priority date
Expiry dateJun 21, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/56
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method is provided for testing magnetic bits (3, 104, 514) of an array. A train of first (702), second (704), and third (706) pulses is provided to a desired bit, the first and second pulses beginning at a substantially similar low field and increasing in similar amounts with respect to successive trains of the first, second, and third pulses, the third pulse having a current amplitude sufficient to toggle the magnetic bit. A representative count is recorded in response to switching of the bit. The above steps are repeated and a determination is made of the current amplitude required to write and toggle the bit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.