Patent · US Expired

Enabling chain scission of branched photoresist

US7166413B2 · kind B2 · utility

1Cited by
4References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 12, 2004
Grant dateJan 23, 2007
Priority date
Expiry dateOct 12, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S522/914
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

By using a branched long chained chain scission polymer as a photoresist for EUV and 157 nanometer applications, a relatively higher molecular weight polymer with good mechanical properties may be achieved. In addition, by using chain scission technology, line edge roughness and resolution may be improved at the same time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.