Patent · US Expired

Phase change memory cell defined by a pattern shrink material process

US7166533B2 · kind B2 · utility

200Cited by
5References
38Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 8, 2005
Grant dateJan 23, 2007
Priority date
Expiry dateApr 8, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8828

Abstract

One embodiment of the present invention provides a memory cell device. The memory cell device includes a first electrode, a phase-change material adjacent the first electrode, and a second electrode adjacent the phase-change material. The phase-change material has a sublithographic width defined by a pattern shrink material process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.