Patent · US Expired

Method for fabricating contact-making connections

US7183188B2 · kind B2 · utility

10Cited by
10References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 2005
Grant dateFeb 27, 2007
Priority date
Expiry dateMar 5, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76858
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention provides a method for fabricating contact-making connections, having the steps of: a) providing a substrate (101) with electronic circuit units (102a, 102b) arranged thereon, an intermediate layer (103) filling an interspace between the electronic circuit units (102a, 102b); an insulation layer (104) being deposited on the electronic circuit units (102a, 102b) and on the intermediate layer (103); a masking layer (105) being deposited on the insulation layer (104); and the masking layer (105) being patterned with a through-plating structure (106); b) patterning a contact-making region by means of the masking layer (105), a contact-making hole (112) being etched through the insulation layer (104) and the intermediate layer (103) as far as the substrate (101), a section of the substrate (101) being uncovered in accordance with the through-plating structure (106); c) filling the contact-making hole (112) with a through-plating material (108); d) polishing back the covering layer (107) deposited on the masking layer (105) as far as the masking layer (105); e) depositing a contact-making layer (109) on the masking layer (105) and the through-plating material, the contact-ma…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.