Patent · US Expired

Semi-conductor component, as well as a process for the in-or output of test data

US7184339B2 · kind B2 · utility

3Cited by

3References

10Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Thorsten Bucksch · Munich, DE
Martin Perner · Birkenfeld, DE
Volker Kilian · Birkenfeld, DE
Martin Meier · Heidenheim, DE

Key dates

Filing date	Oct 20, 2005
Grant date	Feb 27, 2007
Priority date	—
Expiry date	Oct 20, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/1806
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a semi-conductor component, and a process for the in- and/or output of test data and/or semi-conductor component operating control data into or from a semi-conductor component, whereby the semi-conductor component comprises one or more useful data memory cells, and/or one or more test data and/or semi-conductor component operating control data registers for storing test data and/or semi-conductor component operating control data, and whereby the process comprises the steps of applying a control signal to the semi-conductor component, whereby the semi-conductor component is switched from a first to a second operating mode; and applying an address signal to the semi-conductor component, whereby one or more of the test data and/or semi-conductor component operating control data registers of the semi-conductor component is addressed by the address signal in the second operating mode, and one or more of the useful data memory cells in the first operating mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.