Method for selecting transistor threshold voltages in an integrated circuit
US7188325B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2004 |
| Grant date | Mar 6, 2007 |
| Priority date | — |
| Expiry date | Apr 13, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a method for selecting transistor threshold voltages on an integrated circuit may include assigning a first threshold voltage to selected groups of transistors such as cell instances, for example, and determining which of the selected groups of transistors to assign a second threshold voltage, that is lower than the first threshold voltage, by iteratively performing a cost/benefit analysis. The method may further include determining which of the selected groups of transistors having a third threshold voltage to assign the first threshold voltage by iteratively performing a cost/benefit analysis. The cost/benefit analysis may include calculating a cost/benefit ratio for each group of the selected groups of transistors. In addition, the cost/benefit analysis may include calculating an upcone benefit and a downcone benefit for groups of transistors coupled to one or more inputs and outputs, respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.