Patent · US Expired

Flash memory device

US7196372B1 · kind B1 · utility

35Cited by
5References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 8, 2003
Grant dateMar 27, 2007
Priority date
Expiry dateJul 8, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/62

Abstract

A non-volatile memory device includes a substrate, an insulating layer, a fin, an oxide layer, spacers and one or more control gates. The insulating layer is formed on the substrate and the fin is formed on the insulating layer. The oxide layer is formed on the fin and acts as a tunnel oxide for the memory device. The spacers are formed adjacent the side surfaces of the fin and the control gates are formed adjacent the spacers. The spacers act as floating gate electrodes for the non-volatile memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.