Method and apparatus for using clustering method to analyze semiconductor devices
US7197435B1 · kind B1 · utility
1Cited by
2References
16Claims
0Family size
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Key dates
| Filing date | Apr 2, 2004 |
| Grant date | Mar 27, 2007 |
| Priority date | — |
| Expiry date | Jan 8, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing a semiconductor device tests a semiconductor device to produce first and second data. A clustering method is applied to the first data, creating a clustered first data. The clustered first data is then correlated with the second data to determine analyzed data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.