Patent · US Expired

Protecting silicon germanium sidewall with silicon for strained silicon/silicon germanium MOSFETs

US7202132B2 · kind B2 · utility

5Cited by
72References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 16, 2004
Grant dateApr 10, 2007
Priority date
Expiry dateJun 25, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/791

Abstract

Raised Si/SiGe source and drain regions include epitaxially grown silicon on SiGe sidewalls. The epi silicon prevents adverse effects of Ge during silicidation, including Ge out diffusion and silicide line breakage. The Si also increases the active area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.