Protecting silicon germanium sidewall with silicon for strained silicon/silicon germanium MOSFETs
US7202132B2 · kind B2 · utility
5Cited by
72References
32Claims
0Family size
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Key dates
| Filing date | Jan 16, 2004 |
| Grant date | Apr 10, 2007 |
| Priority date | — |
| Expiry date | Jun 25, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/791
Abstract
Raised Si/SiGe source and drain regions include epitaxially grown silicon on SiGe sidewalls. The epi silicon prevents adverse effects of Ge during silicidation, including Ge out diffusion and silicide line breakage. The Si also increases the active area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.