Patent · US Expired

Semiconductor device

US7208797B2 · kind B2 · utility

5Cited by
3References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 2001
Grant dateApr 24, 2007
Priority date
Expiry dateDec 21, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/926

Abstract

There is provided a semiconductor device including a substrate, a device isolation insulating film formed on the substrate, a gate electrode formed on the substrate, a gate wiring layer formed in the device isolation insulating film and connected to the gate electrode, source and drain electrodes arranged on the substrate to face each other via the gate electrode, and an insulating film covering bottom and side surfaces of each of the gate electrode and the gate wiring layer, wherein the gate, source and drain electrodes and gate wiring layer have upper surface levels equal to or lower than that of the device isolation insulating film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.