Patent · US Expired

Single poly non-volatile memory

US7209392B2 · kind B2 · utility

27Cited by
6References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 2005
Grant dateApr 24, 2007
Priority date
Expiry dateApr 9, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An erasable programmable non-volatile memory cell encompasses an ion well; a first select transistor including a select gate, source/drain formed in the ion well, and a channel region formed between its source and drain; a first floating gate transistor having a drain, a source coupled to the drain of the first select transistor, a first floating gate channel region formed between its drain and source, and a common floating gate overlying the floating gate channel region; a second select transistor including a select gate, source/drain formed in the ion well, and a channel region formed between its source and drain; and a second floating gate transistor having a drain, a source coupled to the drain of the second select transistor, a second floating gate channel region formed between its drain and source, and the common floating gate overlying the second floating gate channel region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.