Patent · US Expired

Method and system for simulating a modular test system

US7210087B2 · kind B2 · utility

15Cited by
8References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2004
Grant dateApr 24, 2007
Priority date
Expiry dateJun 2, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31907
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for simulating a modular test system is disclosed. The method includes providing a controller, where the controller controls at least one vendor module and its corresponding device under test (DUT) model, creating a simulation framework for establishing standard interfaces between the at least one vendor module and its corresponding DUT model, configuring the simulation framework, and simulating the modular test system using the simulation framework.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.