Patent · US Expired

Method for enhancing the nucleation and morphology of ruthenium films on dielectric substrates using amine containing compounds

US7211509B1 · kind B1 · utility

50Cited by
3References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 14, 2004
Grant dateMay 1, 2007
Priority date
Expiry dateJun 14, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/28556
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods for depositing a ruthenium metal layer on a dielectric substrate are provided. The methods involve, for instance, exposing the dielectric substrate to an amine-containing compound, followed by exposing the substrate to a ruthenium precursor and an optional co-reactant such that the amine-containing compound facilitates the nucleation on the dielectric surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.