Sample observation method and transmission electron microscope
US7214938B2 · kind B2 · utility
2Cited by
7References
6Claims
0Family size
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Key dates
| Filing date | Sep 19, 2005 |
| Grant date | May 8, 2007 |
| Priority date | — |
| Expiry date | Sep 19, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/221
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Preparations are made for the transmission image of an object tilted as a reference image and the image obtained by polar coordinate conversion of this transmission image, and correlation is established with the image obtained by polar coordinate conversion of the transmission image of the object in a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.