Patent · US Expired

Segmented contactor

US7215131B1 · kind B1 · utility

2Cited by
79References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1999
Grant dateMay 8, 2007
Priority date
Expiry dateJun 7, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49211
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted to a substrate. The contactor units are formed, tested, and assembled to a backing substrate. The contactor units may include leads extending laterally for connection to an external instrument such as a burn-in board. The contactor units include conductive areas such as pads that are placed into contact with conductive terminals on devices under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.