Apparatus and method for testing circuit units to be tested
US7228477B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 12, 2004 |
| Grant date | Jun 5, 2007 |
| Priority date | — |
| Expiry date | May 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31932
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and Method for Testing Circuit Units To Be Tested. According to one aspect, a test apparatus for testing circuit units to be tested, includes a nominal data production unit for production of a nominal data stream, a comparison device for comparison of an actual data stream which is emitted from the circuit unit to be tested as a function of the nominal data stream that is supplied with the nominal data stream; and a compression device for compression of an intermediate result signal which is emitted from the comparison device as a function of the comparison into a test result signal, with the intermediate result signal (108) which is emitted from the comparison device being temporarily stored in a buffer storage device with the intermediate result signal which is temporarily stored in a buffer storage device being read by means of a read unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.