Patent · US Expired

FinFET body contact structure

US7241649B2 · kind B2 · utility

16Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 2004
Grant dateJul 10, 2007
Priority date
Expiry dateMay 17, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/201

Abstract

A FinFET body contact structure and a method for creating the FinFET body contact structure are disclosed. The body contact structure comprises a wide fin portion of a semiconductor fin, the wide fin portion having a polysilicon polygon shape formed on a top surface of the wide fin portion. The polysilicon polygon shape has a center area having no polysilicon. FinFETs are formed on two vertical surfaces of the wide fin portion and gates of the FinFETs are coupled to the polysilicon polygon shape. Top surfaces of the wide fin portion and the polysilicon polygon shape are silicided. Silicide bridging is prevented by sidewall spacers. All convex angles on the polysilicon polygon shape are obtuse enough to prevent creation of bridging vertices. The center area is doped of an opposite type from a source and a drain of an associated FinFET.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.