Patent · US Expired

Method for fabricating a body contact in a Finfet structure and a device including the same

US7244640B2 · kind B2 · utility

19Cited by
9References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 19, 2004
Grant dateJul 17, 2007
Priority date
Expiry dateJan 30, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6711

Abstract

A method for fabricating a Finfet device with body contacts and a device fabricated using the method are provided. In one example, a silicon-on-insulator substrate is provided. A T-shaped active region is defined in the silicon layer of the silicon-on-insulator substrate. A source region and a drain region form two ends of a cross bar of the T-shaped active region and a body contact region forms a leg of the T-shaped active region. A gate oxide layer is grown on the active region. A polysilicon layer is deposited overlying the gate oxide layer and patterned to form a gate, where an end of the gate partially overlies the body contact region to complete formation of a Finfet device with body contact.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.