Chenming Hu
164Patents
45h-index
153Co-inventors
93Inventor score
Filing activity: Aug 1, 1980 → Jul 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6413802B1 | Finfet transistor structures having a double gate channel extending vertically from a substrate and methods of manufacture | Electricity | 598 | Expired |
| US6492216B1 | Method of forming a transistor with a strained channel | Electricity | 317 | Expired |
| US5485031A | Antifuse structure suitable for VLSI application | Electricity | 304 | Expired |
| US5559368A | Dynamic threshold voltage mosfet having gate to body connection for ultra-low voltage operation | Electricity | 261 | Expired |
| US5489792A | Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility | Electricity | 253 | Expired |
| US5448513A | Capacitorless DRAM device on silicon-on-insulator substrate | Physics | 249 | Expired |
| US4794565A | Electrically programmable memory device employing source side injection | Electricity | 205 | Expired |
| US7112495B2 | Structure and method of a strained channel transistor and a second semiconductor component in an integrated circuit | Electricity | 204 | Expired |
| US6867433B2 | Semiconductor-on-insulator chip incorporating strained-channel partially-depleted, fully-depleted, and multiple-gate transistors | Electricity | 201 | Expired |
| US6855990B2 | Strained-channel multiple-gate transistor | Electricity | 183 | Expired |
| US5780899A | Delta doped and counter doped dynamic threshold voltage MOSFET for ultra-low voltage operation | Electricity | 172 | Expired |
| US5982003A | Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility | Electricity | 154 | Expired |
| US6121077A | Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility | Electricity | 146 | Expired |
| US6300649A | Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility | Electricity | 138 | Expired |
| US6518105B1 | High performance PD SOI tunneling-biased MOSFET | Emerging Cross-Sectional Technologies | 130 | Expired |
| US6855606B2 | Semiconductor nano-rod devices | Electricity | 105 | Expired |
| US7180134B2 | Methods and structures for planar and multiple-gate transistors formed on SOI | Electricity | 99 | Expired |
| US7074656B2 | Doping of semiconductor fin devices | Electricity | 98 | Expired |
| US5511020A | Pseudo-nonvolatile memory incorporating data refresh operation | Electricity | 98 | Expired |
| US8067280B2 | High performance CMOS devices and methods for making same | Electricity | 96 | Active |
| US6900502B2 | Strained channel on insulator device | Electricity | 93 | Expired |
| US6720619B1 | Semiconductor-on-insulator chip incorporating partially-depleted, fully-depleted, and multiple-gate devices | Electricity | 89 | Expired |
| US6027988A | Method of separating films from bulk substrates by plasma immersion ion implantation | Emerging Cross-Sectional Technologies | 86 | Expired |
| US7452778B2 | Semiconductor nano-wire devices and methods of fabrication | Electricity | 86 | Expired |
| US6844238B2 | Multiple-gate transistors with improved gate control | Electricity | 83 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.