Patent · US Expired

Probe station with low inductance path

US7250779B2 · kind B2 · utility

28Cited by
501References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 25, 2003
Grant dateJul 31, 2007
Priority date—
Expiry dateSep 25, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2887
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.