John Dunklee
49Patents
13h-index
29Co-inventors
81Inventor score
Filing activity: Jun 30, 1999 → Apr 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7187188B2 | Chuck with integrated wafer support | Physics | 85 | Expired |
| US6815963B2 | Probe for testing a device under test | Physics | 66 | Expired |
| US6861856B2 | Guarded tub enclosure | Physics | 55 | Expired |
| US6445202B1 | Probe station thermal chuck with shielding for capacitive current | Electricity | 52 | Expired |
| US6642732B2 | Probe station thermal chuck with shielding for capacitive current | Electricity | 50 | Expired |
| US7161363B2 | Probe for testing a device under test | Physics | 39 | Expired |
| US7250779B2 | Probe station with low inductance path | Physics | 28 | Expired |
| US7221172B2 | Switched suspended conductor and connection | Physics | 24 | Expired |
| US6512391B2 | Probe station thermal chuck with shielding for capacitive current | Electricity | 19 | Expired |
| US6965226B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 17 | Expired |
| US7138813B2 | Probe station thermal chuck with shielding for capacitive current | Electricity | 16 | Expired |
| US7304488B2 | Shielded probe for high-frequency testing of a device under test | Physics | 15 | Active |
| US7362115B2 | Chuck with integrated wafer support | Physics | 14 | Active |
| US7518358B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 12 | Active |
| US7618590B2 | Fluid dispensing system | Physics | 11 | Active |
| US7501810B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 11 | Active |
| US7514915B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 10 | Active |
| US7221146B2 | Guarded tub enclosure | Physics | 10 | Expired |
| US7352168B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 10 | Expired |
| US7423419B2 | Chuck for holding a device under test | Emerging Cross-Sectional Technologies | 9 | Active |
| US7482823B2 | Shielded probe for testing a device under test | Physics | 9 | Active |
| US6914423B2 | Probe station | Emerging Cross-Sectional Technologies | 9 | Expired |
| US7436194B2 | Shielded probe with low contact resistance for testing a device under test | Physics | 8 | Active |
| US7492172B2 | Chuck for holding a device under test | Physics | 8 | Expired |
| US7518387B2 | Shielded probe for testing a device under test | Physics | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.