Patent · US Expired

Integrated circuit, in particular integrated memory, and methods for operating an integrated circuit

US7263633B2 · kind B2 · utility

1Cited by

11References

15Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Evangelos Stavrou · Munich, DE
Stephan Schröder · Birkenfeld, DE
Manfred Proll · Dorfen, DE
Koen Van der Zanden · Leuven, BE

Key dates

Filing date	May 25, 2004
Grant date	Aug 28, 2007
Priority date	—
Expiry date	Sep 13, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/0407
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An integrated circuit, in particular, an integrated memory, contains a control circuit for ascertaining an operating state of the circuit. A self-repair circuit, which is connected to the control circuit, is used to implement self-test and self-repair operation for checking the functioning of, and repairing, defective circuit sections of the integrated circuit. After a supply voltage has been applied to the integrated circuit, the control circuit ascertains an operating state of the integrated circuit and, in a manner dependent thereon, the self-repair circuit is activated by the control circuit in a self-controlling manner in order to put the integrated circuit into a self-repair mode for implementing self-test and self-repair operation. The integrated circuit can be tested for its functionality and repaired even after being soldered onto a module substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.