Manfred Proll
27Patents
5h-index
24Co-inventors
65Inventor score
Filing activity: Nov 4, 1987 → Jan 13, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7023701B2 | Device for cooling memory modules | Electricity | 73 | Expired |
| US7196554B2 | Integrated clock supply chip for a memory module, memory module comprising the integrated clock supply chip, and method for operating the memory module under test conditions | Physics | 30 | Expired |
| US4810178A | Apparatus for molding outer and inner soles onto shoe uppers | Performing Operations; Transporting | 8 | Expired |
| US6781889B2 | Method for operating a semiconductor memory and semiconductor memory | Physics | 7 | Expired |
| US4960374A | Apparatus for molding outer and inner soles and a sole welt onto shoe uppers | Performing Operations; Transporting | 6 | Expired |
| US6940775B2 | Integrated dynamic memory having a control circuit for controlling a refresh mode for memory cells | Physics | 5 | Expired |
| US6927557B2 | Voltage generator arrangement | Physics | 4 | Expired |
| US7198403B2 | Arrangement for determining a temperature loading of an integrated circuit and method | Electricity | 4 | Expired |
| US7085185B2 | Circuit and method for controlling an access to an integrated memory | Physics | 3 | Expired |
| US7158426B2 | Method for testing an integrated semiconductor memory | Physics | 3 | Expired |
| US7266027B2 | Integrated semiconduct memory with test circuit | Physics | 2 | Expired |
| US7482644B2 | Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memory | Electricity | 2 | Expired |
| US7196572B2 | Integrated circuit for stabilizing a voltage | Physics | 2 | Expired |
| US7102912B2 | Integrated semiconductor memory device and method for operating an integrated semiconductor memory device | Physics | 2 | Expired |
| US6999355B2 | Circuit arrangement and method for setting a voltage supply for a read/write amplifier of an integrated memory | Physics | 2 | Expired |
| US7180820B2 | Integrated semiconductor memory comprising at least one word line and comprising a multiplicity of memory cells | Electricity | 2 | Expired |
| US7206980B2 | Integrated semiconductor memory | Physics | 1 | Expired |
| US7181579B2 | Integrated memory having redundant units of memory cells and method for testing an integrated memory | Physics | 1 | Expired |
| US7263633B2 | Integrated circuit, in particular integrated memory, and methods for operating an integrated circuit | Physics | 1 | Expired |
| US7443713B2 | Integrated semiconductor memory and method for operating a semiconductor memory | Electricity | 1 | Active |
| US6859406B2 | Dynamic RAM semiconductor memory and method for operating the memory | Physics | 1 | Expired |
| US7236412B2 | Integrated semiconductor memory with redundant memory cells replaceable for either true or complementary defective memory cells | Physics | 1 | Expired |
| US6900626B2 | Voltage generator arrangement | Physics | 1 | Expired |
| US6917549B2 | Integrated memory and method for operating it | Physics | 1 | Expired |
| US6992498B2 | Test apparatus for testing integrated modules and method for operating a test apparatus | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.