Patent · US Expired

Method of fabricating heterojunction devices integrated with CMOS

US7265006B2 · kind B2 · utility

16Cited by
6References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 7, 2005
Grant dateSep 4, 2007
Priority date
Expiry dateJul 7, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/811

Abstract

A method of fabricating heterojunction devices, in which heterojunction devices are epitaxially formed on active area regions surrounded by field oxide regions and containing embedded semiconductor wells. The epitaxial growth of the heterojunction device layers may be selective or not and the epitaxial layer may be formed so as to contact individually each one of a plurality of heterojunction devices or contact a plurality of heterojunction devices in parallel. This method can be used to fabricate three-terminal devices and vertically stacked devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.