Patent · US Expired

Via/BSM pattern optimization to reduce DC gradients and pin current density on single and multi-chip modules

US7266788B2 · kind B2 · utility

2Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 19, 2005
Grant dateSep 4, 2007
Priority date
Expiry dateJan 12, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A carrier for an electronic device such as an integrated circuit chip is designed by assigning two different voltage domains to two separate areas of the contact surface of the carrier, while providing a common electrical ground for both voltage domains. The integrated circuit chip may be a microprocessor having a nominal operating voltage, and the different voltages of the two voltage domains are both within the tolerance range of the nominal operating voltage but one of the voltage domains is aligned with a high power density area of the microprocessor (e.g., the microprocessor core) and provides a slightly greater voltage. The higher power voltage domain preferably has a ratio of voltage pins to ground pins that is greater than one.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.