Inventor · Schenefeld, DE

Erich Klink

35Patents
12h-index
54Co-inventors
84Inventor score

Filing activity: Mar 23, 1978 → Jan 17, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US6218631A Structure for reducing cross-talk in VLSI circuits and method of making same using filled channels to minimize cross-talk Electricity 76 Expired
US5016087A Integrated circuit package Emerging Cross-Sectional Technologies 39 Expired
US5157635A Input signal redriver for semiconductor modules Physics 29 Expired
US5812380A Mesh planes for multilayer module Electricity 25 Expired
US5227995A High density semiconductor memory module using split finger lead frame Electricity 22 Expired
US6535075B2 Tunable on-chip capacity Electricity 22 Expired
US5914533A Multilayer module with thinfilm redistribution area Electricity 22 Expired
US5162264A Integrated circuit package Emerging Cross-Sectional Technologies 20 Expired
US6442041B2 MCM—MLC technology Electricity 18 Expired
US6043724A Two-stage power noise filter with on and off chip capacitors Electricity 17 Expired
US7348667B2 System and method for noise reduction in multi-layer ceramic packages Electricity 12 Expired
US6967398B2 Module power distribution network Electricity 12 Expired
US6665843B2 Method and system for quantifying the integrity of an on-chip power supply network Physics 11 Expired
US7302664B2 System and method for automatic insertion of on-chip decoupling capacitors Physics 8 Expired
US4330853A Method of and circuit arrangement for reading and/or writing an integrated semiconductor storage with storage cells in MTL (I.sup.2 L) technology Physics 8 Expired
US5956563A Method for reducing a transient thermal mismatch Electricity 7 Expired
US6424058B1 Testable on-chip capacity Physics 7 Expired
US4542309A Phase splitter with integrated latch circuit Electricity 6 Expired
US4614885A Phase splitter with latch Electricity 5 Expired
US6437252B1 Method and structure for reducing power noise Emerging Cross-Sectional Technologies 5 Expired
US4170017A Highly integrated semiconductor structure providing a diode-resistor circuit configuration Physics 4 Expired
US9134364B2 Determining the current return path integrity in an electric device connected or connectable to a further device Electricity 3 Active
US8248082B2 Method for determining the current return path integrity in an electric device connected or connectable to a further device Electricity 3 Active
US7503111B2 Method for increasing wiring channels/density under dense via fields Emerging Cross-Sectional Technologies 3 Expired
US4313177A Storage cell simulation for generating a reference voltage for semiconductor stores in mtl technology Electricity 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.