Optical testing device
US7268533B2 · kind B2 · utility
6Cited by
501References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2004 |
| Grant date | Sep 11, 2007 |
| Priority date | — |
| Expiry date | Aug 6, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.