Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems

US7274450B1 · kind B1 · utility

Assignee

• J.A. WOOLLAM CO., INC. · US

Inventors

• Steven E. Green · Lincoln, US
• Ping He · Lincoln, US
• Galen L. Pfeiffer · Lincoln, US
• Brian D. Guenther · Lincoln, US
• Gerald T. Cooney · Lincoln, US
• John A. Woollam · Lincoln, US
• Martin M. Liphardt · Lincoln, US
• Blaine D. Johs · Lincoln, US
• Craig M. Herzinger · Lincoln, US

Key dates

• Filing date: May 28, 2004
• Grant date: Sep 25, 2007
• Expiry date: Oct 17, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/211
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the subspace. Contained within the generally enclosed space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are adversely affected, (eg. absorbed), by typical atmospheric contents.